Paper
15 March 1996 Elemental analysis of kinematic optically variable devices
Michael M. Chamberlain
Author Affiliations +
Proceedings Volume 2659, Optical Security and Counterfeit Deterrence Techniques; (1996) https://doi.org/10.1117/12.235459
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States
Abstract
OVDs are increasingly used as a means of authenticating documents or reducing the chances of successful counterfeiting. Kinematic effects are those observed when certain image elements appear to move on rotation or tilting of the substrate. Examples of devices showing these effects are described as 'Kinegrams' or 'Exelgrams' or, more recently, 'Kineforms.' All are produced by the creation of microscopic diffracting structures. All have in common: graphical animation, well defined mutual movements, an abandonment of holographic three dimensionality, and the ability to perform under diffuse lighting conditions and under most viewing angles. The images are not based on objects but are computer generated. Their principal advantage is that they can only be produced using highly sophisticated manufacturing techniques. These techniques are radically different from each other, and it is therefore surprising that the observed effects are so similar. This paper attempts to describe the observed features of kinematic OVDs in a structured way and to assess their relative performance on a micro as well as a macro scale, using a mixture of optical and scanning electron microscopy. It is hoped that this work will contribute towards a system of classification of KOVDs which will assist prospective users in the specification of such products.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Chamberlain "Elemental analysis of kinematic optically variable devices", Proc. SPIE 2659, Optical Security and Counterfeit Deterrence Techniques, (15 March 1996); https://doi.org/10.1117/12.235459
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KEYWORDS
Diffraction gratings

Kinematics

Diffraction

Scanning electron microscopy

Microscopes

Light sources and illumination

Classification systems

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