Paper
5 February 1996 Determination of the nonlinear refraction through the measurement of light wavefront distortions
Aristides Marcano Olaizola, Herve Maillotte, D. Gindre, D. Metin
Author Affiliations +
Proceedings Volume 2730, Second Iberoamerican Meeting on Optics; (1996) https://doi.org/10.1117/12.231107
Event: Second Iberoamerican Meeting on Optics, 1995, Guanajuato, Mexico
Abstract
A method for the measurement of the nonlinear refraction and absorption in optical materials studying the distortions of the wavefront of light beams is proposed. Using a one-shot CCD camera, the beam profile changes are recorded for different cell positions. Usual Z-scan, eclipse Z-scan and the total profile distortion signals can be extracted from these data. Proportionality between the measured total signal and the induced phase shift is demonstrated. A comparison between this signal and the usual Z-scan signal is performed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aristides Marcano Olaizola, Herve Maillotte, D. Gindre, and D. Metin "Determination of the nonlinear refraction through the measurement of light wavefront distortions", Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); https://doi.org/10.1117/12.231107
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KEYWORDS
Phase shifts

Refraction

Optical testing

Cameras

CCD cameras

Nonlinear optics

Photography

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