Accurate 3D measurement using a structured light system

Robert J. Valkenburg; Alan M. McIvor

doi:10.1117/12.263312

20 January 1997 Accurate 3D measurement using a structured light system

Robert J. Valkenburg, Alan M. McIvor

Proceedings Volume 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II; (1997) https://doi.org/10.1117/12.263312
Event: Photonics East '96, 1996, Boston, MA, United States

Abstract

This paper discusses a method for obtaining accurate 3D measurements using a temporally encoded structured light system. An objective of the work was to have a balance in the accuracy of all components in the system. This was achieved by including lens distortion in the modes for both the camera and projector which comprise the structured light system. In addition, substripe estimation was used to estimate projector stripe values as a complement to subpixel estimators used for locating image features. Experimental evaluation shows that it is important to use substripe estimation and incorporate lens distortion in the projector model.

Citation Download Citation

Robert J. Valkenburg and Alan M. McIvor "Accurate 3D measurement using a structured light system", Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); https://doi.org/10.1117/12.263312

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