X-Ray tomography with micrometer spatial resolution

Carsten Raven; Anatoly A. Snigirev; Andreas Koch; Irina Snigireva; Victor Kohn

doi:10.1117/12.292719

24 October 1997 X-Ray tomography with micrometer spatial resolution

Carsten Raven, Anatoly A. Snigirev, Andreas Koch, Irina Snigireva, Victor Kohn

Proceedings Volume 3149, Developments in X-Ray Tomography; (1997) https://doi.org/10.1117/12.292719
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

3D computed tomographic images with micrometer resolution were made in phase-contrast mode with high energy x-rays at a third generation synchrotron source. The phase-contrast technique enables one to obtain information not only about the amplitude of the wave field behind the object and thus about the absorption, but also about the refractive index distribution inside the sample. Increasing the x-ray energy from the soft x-ray region up to 10-60 keV simplifies the experimental setup and opens the possibility to study organic samples at room-temperature and under normal pressure conditions. The projection data is recorded with a fast, high-resolution x-ray camera consisting of a 5 micrometers thin YAG scintillator crystal, a visible light microscope optics and a slow scan 1k X 1k CCD camera. The spatial resolution of phase-contrast microtomography is currently limited by the resolution of the x-ray detector to about 1-2 micrometers . First applications in biology and geophysics are shown.

Citation Download Citation

Carsten Raven, Anatoly A. Snigirev, Andreas Koch, Irina Snigireva, and Victor Kohn "X-Ray tomography with micrometer spatial resolution", Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); https://doi.org/10.1117/12.292719

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