Subpicosecond  time-resolved x-ray measurements

Ronnie L. Shepherd; Rex Booth; Bruce KF Young; Dwight F. Price; Richard More; Richard W. Lee; Richard E. Stewart

doi:10.1117/12.290263

14 October 1997 Subpicosecond time-resolved x-ray measurements

Ronnie L. Shepherd, Rex Booth, Bruce KF Young, Dwight F. Price, Richard More, Richard W. Lee, Richard E. Stewart

Proceedings Volume 3157, Applications of X Rays Generated from Lasers and Other Bright Sources; (1997) https://doi.org/10.1117/12.290263
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The emission of ultrashort thermal x-ray radiation is shown to be controlled by two factors; peak temperature and the population of `cold' electrons. Two experiments are used to illustrate these mechanisms. The first measures the time history of 50 angstroms - 130 angstroms x-rays from ultrashort pulse laser heated solid targets. This experiment is used to illustrate the effect of the peak temperature on the full width at half maximum of the emission. The second experiment measures the dependency of decay time of the 1s²(S₀) - 1s2p(¹P₁) transition (He_(alpha )) emission on target thickness. This is used to infer the effects of unheated material or `cold' electrons on the time history of the x-ray emission.

Citation Download Citation

Ronnie L. Shepherd, Rex Booth, Bruce KF Young, Dwight F. Price, Richard More, Richard W. Lee, and Richard E. Stewart "Subpicosecond time-resolved x-ray measurements", Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); https://doi.org/10.1117/12.290263

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