Transient x-ray diffraction and its application to materials science and x-ray optics

Allan A. Hauer; Justin S. Wark; Daniel H. Kalantar; Bruce A. Remington; Roger A. Kopp; James A. Cobble; Bruce Failor; George A. Kyrala; M. Meyers; R. Springer; Thomas R. Boehly

doi:10.1117/12.283986

14 October 1997 Transient x-ray diffraction and its application to materials science and x-ray optics

Allan A. Hauer, Justin S. Wark, Daniel H. Kalantar, Bruce A. Remington, Roger A. Kopp, James A. Cobble, Bruce Failor, George A. Kyrala, M. Meyers, R. Springer, Thomas R. Boehly

Author Affiliations +

Proceedings Volume 3157, Applications of X Rays Generated from Lasers and Other Bright Sources; (1997) https://doi.org/10.1117/12.283986
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasma as the x-ray source for transient diffraction.

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Allan A. Hauer, Justin S. Wark, Daniel H. Kalantar, Bruce A. Remington, Roger A. Kopp, James A. Cobble, Bruce Failor, George A. Kyrala, M. Meyers, R. Springer, and Thomas R. Boehly "Transient x-ray diffraction and its application to materials science and x-ray optics", Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); https://doi.org/10.1117/12.283986

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