Paper
10 December 1997 All-optic-fiber phase-shifting ESPI inspection system
Hua Fan, Yuanhe Song, Yushan Tan
Author Affiliations +
Proceedings Volume 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III; (1997) https://doi.org/10.1117/12.294465
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States
Abstract
The all optic fiber phase-shifting electronic speckle pattern interferometry (ESPI) is studied in this paper, which has the following advantages: (1) low cost; (2) reduction of the unreliable factors generated by separated optic components; (3) simplification of the optic configuration; (4) great reduction of volume; (5) flexibility, to be easily designed into different structures to adapt to inaccessible environments such as pipeline cavity and so on. All optic fiber ESPI inspection systems, sensitive to in-plane and off- plane displacement, are presented and practical measurement has been carried out in defect testing of carbon fiber material and crack testing. The results are satisfactory.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hua Fan, Yuanhe Song, and Yushan Tan "All-optic-fiber phase-shifting ESPI inspection system", Proc. SPIE 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December 1997); https://doi.org/10.1117/12.294465
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Inspection

Phase shifts

Carbon

Electronic components

Interferometry

Optical inspection

Speckle pattern

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