Paper
1 April 1998 Large-area low-noise amorphous silicon imaging system
Raj B. Apte, Robert A. Street, Steve E. Ready, David A. Jared, Andrew M. Moore, Richard L. Weisfield, T. A. Rodericks, T. A. Granberg
Author Affiliations +
Proceedings Volume 3301, Solid State Sensor Arrays: Development and Applications II; (1998) https://doi.org/10.1117/12.304549
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
2D amorphous silicon arrays can be sued for medical imaging, non-destructive testing, and high-speed document scanning. We have built a 200 spi imaging system with an active area containing 2304 X 3200 pixels, the largest amorphous silicon imaging system described to data. Packaged with the array are peripheral electronics which include active matrix drivers, charge sensitive amplifiers, two 12 bit A/D converters, and control logic. Digital data travel via fiber to a frame grabber in a personal computer. Software includes gain/offset corrections, line and pixel corrections, window and level controls, and a user interface. Through a combination of layout optimization, amplifier design, and system timing, we have demonstrated a noise level of 1.5 Ke RMS and a signal to noise ratio of 1900.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raj B. Apte, Robert A. Street, Steve E. Ready, David A. Jared, Andrew M. Moore, Richard L. Weisfield, T. A. Rodericks, and T. A. Granberg "Large-area low-noise amorphous silicon imaging system", Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); https://doi.org/10.1117/12.304549
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Cited by 10 scholarly publications.
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KEYWORDS
Signal to noise ratio

Imaging systems

Amorphous silicon

Interference (communication)

Amplifiers

Capacitance

Electronics

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