Optical methods of control and characterization of materials for infrared detectors

Yuri V. Vorobiev; Jesus Gonzalez-Hernandez; Martin Yanez-Limon; Juan Francisco Perez-Robles; Francisco J. Espinoza-Beltran; Rafael Ramirez-Bon; Valery N. Zakharchenko; Roman V. Zakharchenko

doi:10.1117/12.306201

20 April 1998 Optical methods of control and characterization of materials for infrared detectors

Yuri V. Vorobiev, Jesus Gonzalez-Hernandez, Martin Yanez-Limon, Juan Francisco Perez-Robles, Francisco J. Espinoza-Beltran, Rafael Ramirez-Bon, Valery N. Zakharchenko, Roman V. Zakharchenko

Author Affiliations +

Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306201
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine

Abstract

A brief review is made of some classic and novel experimental techniques allowing the determination of the main parameters of semiconducting materials with the application of purely optical excitation. Among them some modifications of the photothermoacoustical method (in particular, with the pulse excitation), plasma reflection, sample scanning with the intense light beam.

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Yuri V. Vorobiev, Jesus Gonzalez-Hernandez, Martin Yanez-Limon, Juan Francisco Perez-Robles, Francisco J. Espinoza-Beltran, Rafael Ramirez-Bon, Valery N. Zakharchenko, and Roman V. Zakharchenko "Optical methods of control and characterization of materials for infrared detectors", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306201

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