Possibility of excitation temperature determination by relative deviation plot of line intensities

Alexandre F. Semerok

doi:10.1117/12.308648

26 May 1998 Possibility of excitation temperature determination by relative deviation plot of line intensities

Alexandre F. Semerok

Proceedings Volume 3404, ALT'97 International Conference on Laser Surface Processing; (1998) https://doi.org/10.1117/12.308648
Event: ALT '97 International Conference on Laser Surface Processing, 1997, Limoges, France

Abstract

Method of relative deviation plot of line intensities for LTE presence verification and excitation temperature determination is suggested and analyzed. This method seems to be attractive as it does not require the values of the Einstein constants A_ji of spontaneous emission.

Citation Download Citation

Alexandre F. Semerok "Possibility of excitation temperature determination by relative deviation plot of line intensities", Proc. SPIE 3404, ALT'97 International Conference on Laser Surface Processing, (26 May 1998); https://doi.org/10.1117/12.308648

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