Fringe pattern analysis methods: up-to-date review

Malgorzata Kujawinska; Wolfgang Osten

doi:10.1117/12.323363

29 September 1998 Fringe pattern analysis methods: up-to-date review

Proceedings Volume 3407, International Conference on Applied Optical Metrology; (1998) https://doi.org/10.1117/12.323363
Event: International Conference on Applied Optical Metrology, 1998, Balatonfured, Hungary

Abstract

The paper is intended to be a review of fringe pattern analysis, FPA methods and their capabilities to analyze extended class of fringe patterns. The special emphasis is paid to the distinction between passive and active methods and the general trend to hybridization of the approaches in FPA. More detailed description is given to the general description of the most commonly used FPA methods, namely: temporal and spatial carrier phase shifting methods. Latter various approaches to absolute phase determination basing an application of additional means or modification of system parameters and including fringe numbering, phase unwrapping or hierarchical unwrapping are analyzed and compassed.

Citation Download Citation

Malgorzata Kujawinska and Wolfgang Osten "Fringe pattern analysis methods: up-to-date review", Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); https://doi.org/10.1117/12.323363

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