Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO

Douglas B. Leviton; Timo T. Saha; Larry D. Gardner

doi:10.1117/12.333616

17 December 1998 Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO

Douglas B. Leviton, Timo T. Saha, Larry D. Gardner

Proceedings Volume 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II; (1998) https://doi.org/10.1117/12.333616
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Chemically-vapor-deposited (CVD) silicon carbide (SiC) has become a popular mirror material for spaceborne solar instrumentation for the vacuum ultraviolet wavelength range due to its appreciable broadband reflectance and favorable thermal and opto-mechanical properties. Scatter from surfaces of mirrors operating in this wavelength range can destroy otherwise good image contrast especially for extended targets such as the sun. While valid far ultraviolet (FUV) scatter measurements are entirely non-trivial to conduct and so are rarely performed, visible light scatter measurements are comparatively easy. Unfortunately, it is not straightforward to predict FUV scatter performance based on visible light scatter measurements for mirrors made of CVD SiC. It is hoped that by carrying out scatter measurements in both wavelength regimes for the same CVD SiC mirror, that the ability to make such predictions may be enhanced. Visible light (633 nm) scatter measurements were performed at Goddard Space Flight Center (GSFC) by two different means on CVD SiC telescope mirrors (from the same process and same vendor) for two instruments on the Solar and Heliospheric Observatory (SOHO) - - the Ultraviolet Coronagraph Spectrometer (UVCS) and Solar Ultraviolet Measurement of Emitted Radiation (SUMER). Additionally, extensive FUV scatter measurements were made for SUMER telescope mirrors. In this paper, we correlate the results for those FUV and visible light scatter measurements for this important material.

Citation Download Citation

Douglas B. Leviton, Timo T. Saha, and Larry D. Gardner "Far-ultraviolet and visible light scatter measurements for CVD SiC mirrors for SOHO", Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); https://doi.org/10.1117/12.333616

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available