Test results of the readout electronics for nuclear applications (RENA) chip developed for position-sensitive solid state detectors

Scott D. Kravis; Tumay O. Tumer; Gerald J. Visser; Dale G. Maeding; Shi Yin

doi:10.1117/12.330296

10 November 1998 Test results of the readout electronics for nuclear applications (RENA) chip developed for position-sensitive solid state detectors

Scott D. Kravis, Tumay O. Tumer, Gerald J. Visser, Dale G. Maeding, Shi Yin

Author Affiliations +

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330296
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A mixed signal Application Specific Integrated Circuit chip for front end readout electronics of position sensitive solid state detectors has been developed. It is called RENA. This chip can be used for large number of channels and high energy resolution astrophysics and nuclear physics detectors. It can also be used for medical and industrial imaging of x-rays and gamma rays. The RENA chip is a monolithic integrated circuit and has 32 channels with low noise charge sensitive amplifiers followed by a polarity amplifier and a high quality shaper circuit. It works in pulse counting mode with good energy resolution. It also has a self triggering output which is essential for nuclear applications when the incident radiation arrives at random. Different, externally selectable, operational modes that include a sparse readout mode are available to increase data throughput. It also has externally selectable shaping times. A full scale prototype RENA chip has been manufactured. The preliminary results of test done on the prototype chip are presented.

Citation Download Citation

Scott D. Kravis, Tumay O. Tumer, Gerald J. Visser, Dale G. Maeding, and Shi Yin "Test results of the readout electronics for nuclear applications (RENA) chip developed for position-sensitive solid state detectors", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330296

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