Complex analysis in 3D of the generic arbitrary bilateral fin lines

Humberto Cesar Chaves Fernandes; Jarbas de Albuquerque Sales Neto

doi:10.1117/12.331161

13 November 1998 Complex analysis in 3D of the generic arbitrary bilateral fin lines

Humberto Cesar Chaves Fernandes, Jarbas de Albuquerque Sales Neto

Proceedings Volume 3465, Millimeter and Submillimeter Waves IV; (1998) https://doi.org/10.1117/12.331161
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness, simultaneity at the first time. Also the concise Transverse Transmission Line -- TTL full wave method is used, in the analysis. New results of the complex propagation and of the characteristic impedance as function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3-D.

Citation Download Citation

Humberto Cesar Chaves Fernandes and Jarbas de Albuquerque Sales Neto "Complex analysis in 3D of the generic arbitrary bilateral fin lines", Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); https://doi.org/10.1117/12.331161

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