Scanning near-field optical microscopy: transfer function and resolution limit

Peter Blattner; Peter Kipfer; Hans Peter Herzig; Rene Daendliker

doi:10.1117/12.326824

13 October 1998 Scanning near-field optical microscopy: transfer function and resolution limit

Peter Blattner, Peter Kipfer, Hans Peter Herzig, Rene Daendliker

Proceedings Volume 3467, Far- and Near-Field Optics: Physics and Information Processing; (1998) https://doi.org/10.1117/12.326824
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, we discuss the evanescent-to- propagating conversion capability of different probe tips.

Citation Download Citation

Peter Blattner, Peter Kipfer, Hans Peter Herzig, and Rene Daendliker "Scanning near-field optical microscopy: transfer function and resolution limit", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326824

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