Paper
6 October 1998 Application of SKIPSM to various 3x3 image processing operations
Author Affiliations +
Proceedings Volume 3521, Machine Vision Systems for Inspection and Metrology VII; (1998) https://doi.org/10.1117/12.326969
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States
Abstract
Most of the published work about SKIPSM (Separated-Kernel Image Processing using finite-State Machines) has concentrated on large-neighborhood operations (e.g., binary morphology, Gaussian blur), because the speed improvements are the most dramatic in such cases. However, there are many frequently, used 3 X 3 operations that could also benefit from speed improvements that arise from separability and the use of finite-state machines. This paper shows SKIPSM implementations for an extensive list of 3 X 3 operations, including various edge detectors, connectivity detectors, direction of brightest neighbor, largest gradient, and direction of largest gradient. A generic implementation applicable to all 3 X 3 binary operations, whether separable of non-separate, is also given.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederick M. Waltz "Application of SKIPSM to various 3x3 image processing operations", Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); https://doi.org/10.1117/12.326969
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Cited by 9 scholarly publications.
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KEYWORDS
Image processing

Binary data

Aluminum

Sensors

Remote sensing

Bismuth

Edge detection

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