Paper
14 January 1999 Nondestructive quantification of internal damage in rough rice caused by insects and fungus
Anthony J. Cardarelli, Yang Tao, John L. Bernhardt, Fleet N. Lee
Author Affiliations +
Proceedings Volume 3543, Precision Agriculture and Biological Quality; (1999) https://doi.org/10.1117/12.336873
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States
Abstract
A machine vision system was developed to inspect and estimate the internal damage of rough rice. A modified dark field illumination technique was use to direct light through the rice kernels without saturating the CCD camera. Under modified dark field illumination, the good portions of the rice kernels appeared translucent, while the damaged portions appeared opaque as well as some portions of the hull and the germ of the kernel. A combination of thresholding and morphological operators were used to segment the dark areas and to approximate the actual damaged area. The rice was visually separated into categories of undamaged, spot dammed, and damaged by trained entomologist and plant pathologists. The machine vision system was 91.5 percent successful overall for correctly categorizing a test sample of rice kernels.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anthony J. Cardarelli, Yang Tao, John L. Bernhardt, and Fleet N. Lee "Nondestructive quantification of internal damage in rough rice caused by insects and fungus", Proc. SPIE 3543, Precision Agriculture and Biological Quality, (14 January 1999); https://doi.org/10.1117/12.336873
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Avalanche photodetectors

Machine vision

Imaging systems

Inspection

Binary data

Glasses

CCD cameras

Back to Top