Scanning multiple vernier etalons

Hongbin Chen; Junyi Gao; Zhiben Gong

doi:10.1117/12.318319

5 August 1998 Scanning multiple vernier etalons

Hongbin Chen, Junyi Gao, Zhiben Gong

Proceedings Volume 3557, Current Developments in Optical Elements and Manufacturing; (1998) https://doi.org/10.1117/12.318319
Event: Photonics China '98, 1998, Beijing, China

Abstract

Two identical mirrors of finite intensity reflectivity R that are separated by a distance L construct a conventional etalon. If one mirror is mounted on a piezoelectric element to permit scanning of the length of the etalon, it can be used to determine the wavelength of laser with the help of a well-known spectral line in limited range (one or several free spectral ranges of the etalon). Here we invent a kind of compact scanning multiple vernier etalon (MVET), which can measure laser wavelength and analyze laser spectral lines in wide wavelength range limited only by the response of the detectors and optics. Scanning MVET are constructed by several parallel pairs of etalons of slightly different thickness. All etalons have one common end mirror driven by a tubular piezoelectric element to permit scanning synchronously. If a laser beam is split into scanning MVET, transmission data from several etalons is gathered and several interference patterns are obtained. Analyzing these patterns, the laser wavelength can be determined with the calibrated free spectral ranges. We have developed a novel compact wavemeter for continuous wave laser by using this technique.

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Hongbin Chen, Junyi Gao, and Zhiben Gong "Scanning multiple vernier etalons", Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); https://doi.org/10.1117/12.318319

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KEYWORDS

Fabry–Perot interferometers

Mirrors

Sensors

Beam splitters

Calibration

Error analysis

Laser development

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