Paper
12 April 1999 Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs
Steven L. Wright, Steven Millman, Manabu Kodate
Author Affiliations +
Proceedings Volume 3636, Flat Panel Display Technology and Display Metrology; (1999) https://doi.org/10.1117/12.344647
Event: Electronic Imaging '99, 1999, San Jose, CA, United States
Abstract
Capacitance crosstalk and TFT photoleakage affect the transmission-voltage array characteristics in high- resolution TFTLCDs. These effects depend upon the drive inversion scheme use, and are image-dependent. Photoleakage can also be a cause of flicker in TFTLCDs at low frame rates. One characterization method utilizes comparison of front-of-screen measurements with either measured test cells or theoretical cell characteristics. A second method utilizes digital crosstalk compensation, in which the image data provided to the panel is modified to offset the effects of crosstalk in various test image patterns.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven L. Wright, Steven Millman, and Manabu Kodate "Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs", Proc. SPIE 3636, Flat Panel Display Technology and Display Metrology, (12 April 1999); https://doi.org/10.1117/12.344647
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Liquid crystals

Capacitance

LCDs

Visualization

Digital imaging

Prototyping

Capacitive coupling

RELATED CONTENT

An Inexpensive Electronic Viewbox
Proceedings of SPIE (June 27 1988)
Voxel-based spatial display
Proceedings of SPIE (April 15 1994)

Back to Top