Improving the processing speed of an optoelectronic morphological industrial inspection processor

Haisong Liu; Minxian Wu; Guofan Jin; Qingsheng He; Yingbai Yan

doi:10.1117/12.341140

8 March 1999 Improving the processing speed of an optoelectronic morphological industrial inspection processor

Haisong Liu, Minxian Wu, Guofan Jin, Qingsheng He, Yingbai Yan

Proceedings Volume 3652, Machine Vision Applications in Industrial Inspection VII; (1999) https://doi.org/10.1117/12.341140
Event: Electronic Imaging '99, 1999, San Jose, CA, United States

Abstract

In this paper, we present several methods to improve the processing speed of an optoelectronic morphological industrial inspection processor, which uses an incoherent correlator as its optical hardware and the extensive complementary encoding morphological hit-or-miss transform as its detection algorithm. The first method is using a multi-channel correlation scheme, in which four database images are processed simultaneously so that the LCD panel needs only update 25 times for a set of 100 images, for instance. The second method is using a postprocessing method for the optical correlation output plane. An absolute difference measurement algorithm is applied for measuring the similarity of the optical correlation resultant images, and then the similarity between the tested and the reference image can be deduced. By this method, the complicated preprocessing procedure including the extensive complementary encoding can be simplified because we can directly deal with the gray-scale images. The third method is using a photorefractive correlator instead of the incoherent correlator so that their is not the update rate limitation of the LCD panel, which was a main problem facing any optoelectronic hybrid system.

Citation Download Citation

Haisong Liu, Minxian Wu, Guofan Jin, Qingsheng He, and Yingbai Yan "Improving the processing speed of an optoelectronic morphological industrial inspection processor", Proc. SPIE 3652, Machine Vision Applications in Industrial Inspection VII, (8 March 1999); https://doi.org/10.1117/12.341140

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KEYWORDS

Optical correlators

Inspection

LCDs

Optoelectronics

Image processing

Computer programming

Photorefractive correlators

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