Paper
31 May 1999 Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer
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Abstract
A simple procedure is developed for the measurement of the differential quadratic electro-optic coefficient, R33, by two-beam polarization (TBP) interferometry. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry-Perot effect. The measured values of the differential effective Kerr coefficient, R33 of lead zirconate titanate 52/48 thin film lie inside the interval between -0.5 * 10-18 m2/V2 and +1.7 * 10-18 m2/V2 for the external DC field from -160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential electro-optic coefficients and field-induced birefringence is discussed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vasilii V. Spirin, Mikhail G. Shlyagin, Serguei V. Miridonov, and Kwangsoo No "Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer", Proc. SPIE 3670, Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (31 May 1999); https://doi.org/10.1117/12.349722
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KEYWORDS
Interferometers

Thin films

Electro optics

Ferroelectric materials

Birefringence

Polarization

Refractive index

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