Paper
25 June 1999 Mechanical distortions in advanced optical reticles
Author Affiliations +
Abstract
Finite element models have been developed and refined to simulate the mechanical distortions associated with mask blank fabrication, pattern transfer, and exposure clamping. By modeling the substrate with layers associated with the mask fabrication process and then by prestressing specified layers, the resulting out-of-plane and in-plane distortions of the mask blank have been determined. Etching procedures were subsequently simulated to assess the pattern transfer distortions associated with both dark and bright field masks. Investigations included substrate materials which have acceptable optical transmission for wavelengths below 180 nm. Additional mechanical distortions associated with clamping the reticle into the exposure mount have also been considered.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew R. Mikkelson, Roxann L. Engelstad, Edward G. Lovell, Theodore M. Bloomstein, and Mark E. Mason "Mechanical distortions in advanced optical reticles", Proc. SPIE 3676, Emerging Lithographic Technologies III, (25 June 1999); https://doi.org/10.1117/12.351143
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Photomasks

Chromium

Silica

Reticles

Magnesium fluoride

Mask making

Device simulation

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