Paper
26 July 1999 Resolution and DOF improvement through the use of square-shaped illumination
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Abstract
As optical lithography is pushed to smaller dimensions, methods of resolution enhancement are considered necessary. Illumination modification is getting a good deal of attention, through strong and weak off-axis methods. The shape of an illumination profile does not need to be circular, especially if X/Y feature orientation is considered. This paper describes the improvements in imaging that are possible through use of source shapes that have various degrees of square character. Applications are discussed and interaction with optical proximity correction, aberration, and other imagin factors are addressed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce W. Smith, Lena Zavyalova, S. G. Smith, and John S. Petersen "Resolution and DOF improvement through the use of square-shaped illumination", Proc. SPIE 3679, Optical Microlithography XII, (26 July 1999); https://doi.org/10.1117/12.354352
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Objectives

Diffraction

Monochromatic aberrations

Nanoimprint lithography

Lithographic illumination

Fiber optic illuminators

Optical proximity correction

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