Paper
5 May 1999 Displacement threshold energies of impurity atoms in GaAs heterostructures
Boris J. Ber, Yuri A. Kudrjavtsev, Vladimir S. Kharlamov, Yuri V. Trushin, Evgeni E. Zhurkin
Author Affiliations +
Proceedings Volume 3687, International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (1999) https://doi.org/10.1117/12.347435
Event: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 1998, St. Petersburg, Russian Federation
Abstract
The new approach for the determination of displacement threshold energies (Ed) of impurity atoms in multicomponent targets has been proposed. The approach combines an experimental SIMS-profiling technique and a computer simulation by a dynamic DYTRIRS code. The developed approach was applied for the determination of Ed the for Al and In impurity atoms in GaAs targets.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Boris J. Ber, Yuri A. Kudrjavtsev, Vladimir S. Kharlamov, Yuri V. Trushin, and Evgeni E. Zhurkin "Displacement threshold energies of impurity atoms in GaAs heterostructures", Proc. SPIE 3687, International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 May 1999); https://doi.org/10.1117/12.347435
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KEYWORDS
Chemical species

Gallium arsenide

Ions

Computer simulations

Sputter deposition

Aluminum

Monte Carlo methods

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