Direct observation of charge gratings on photorefractive materials using force microscopy

W. Krieger; E. Soergel; G. Roesel; Herbert Walther

doi:10.1117/12.340148

25 February 1999 Direct observation of charge gratings on photorefractive materials using force microscopy

W. Krieger, E. Soergel, G. Roesel, Herbert Walther

Proceedings Volume 3736, ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements; (1999) https://doi.org/10.1117/12.340148
Event: ICONO '98: Laser Spectroscopy and Optical Diagnostics: Novel Trends and Applications in Laser Chemistry, Biophysics, and Biomedicine, 1998, Moscow, Russian Federation

Abstract

Light-induced charge gratings on photorefractive materials are investigated using electrostatic force detection with an atomic force microscope. The high sensitivity of the detection method permits - for the first time - the study of charge gratings on very thin photorefractive polymer films (50nm and 80 nm), which cannot be investigated by optical means. Profiles of charge gratings on Bi₁₂SiO₂₀ crystals and on polymer films are observed. In addition, the time development of such profiles during the writing process and the decay is investigated. The excellent lateral resolution of the force measurements leads to the detection of a nanostructure in the charge distribution, which is attributed to surface imperfections and changes in the chemical composition of the materials.

Citation Download Citation

W. Krieger, E. Soergel, G. Roesel, and Herbert Walther "Direct observation of charge gratings on photorefractive materials using force microscopy", Proc. SPIE 3736, ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements, (25 February 1999); https://doi.org/10.1117/12.340148

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