Paper
17 September 1999 Diffraction grating groove analysis used to predict efficiency and scatter performance
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Abstract
Atomic force microscopy and other advanced metrology tools now allow detailed determination of the groove profiles and surface morphology of diffraction gratings and other diffractive structures. Modern electromagnetic models allow prediction of the efficiency performance of diffraction gratings in many applications. In addition, tools exist to predict the scatter from low roughness mirrors such as are used for ultraviolet to X-ray optical systems. We describe a program to apply these tools and software developed using commercial off the shelf tools such as IDL and PcGrate to a highly selected set of diffraction gratings developed for the HST/STIS instruments. Both efficiency and scatter predictions are compared with experimental data.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David A. Content "Diffraction grating groove analysis used to predict efficiency and scatter performance", Proc. SPIE 3778, Gradient Index, Miniature, and Diffractive Optical Systems, (17 September 1999); https://doi.org/10.1117/12.363756
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Cited by 9 scholarly publications.
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KEYWORDS
Diffraction gratings

Atomic force microscopy

Data modeling

Polarization

Metrology

Reflectivity

Wavefronts

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