New method for analysis of planar optical waveguide with arbitrary distribution of dielectric constant profile

Nikolai D. Espinosa Ortiz; Jesus Vila; Manuel Cuesta

doi:10.1117/12.363748

17 September 1999 New method for analysis of planar optical waveguide with arbitrary distribution of dielectric constant profile

Nikolai D. Espinosa Ortiz, Jesus Vila, Manuel Cuesta

Author Affiliations +

Proceedings Volume 3778, Gradient Index, Miniature, and Diffractive Optical Systems; (1999) https://doi.org/10.1117/12.363748
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

A new method is proposed for the analysis of singlemodes and multimodes planar gradient waveguides, with arbitrary distribution of the constant dielectric (epsilon) (y). The method designated (alpha) k permits the calculation of the propagation constants, critical frequencies and the TE and TM modes. The method allows one to determine the distribution of (epsilon) (y) from experimental model or from a theoretical model. In this work two theoretical models of the distribution of (epsilon) (y), that permit to simulate and analyze the assorted cases of planar optical waveguides are proposed. The (alpha) k method, can be used to draw the refractive index profile, based upon the values of the propagation constants obtained experimentally.

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Nikolai D. Espinosa Ortiz, Jesus Vila, and Manuel Cuesta "New method for analysis of planar optical waveguide with arbitrary distribution of dielectric constant profile", Proc. SPIE 3778, Gradient Index, Miniature, and Diffractive Optical Systems, (17 September 1999); https://doi.org/10.1117/12.363748

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