Method and system of compensating test for high-order aspherics

Guanqing Lin; Meiliang Yi

doi:10.1117/12.369211

11 November 1999 Method and system of compensating test for high-order aspherics

Guanqing Lin, Meiliang Yi

Proceedings Volume 3782, Optical Manufacturing and Testing III; (1999) https://doi.org/10.1117/12.369211
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We present the essential structures of compensating test system for high order aspherical plates and high order aspherical surfaces, of which R-C and Quasi-R-C systems with aperture of 1 meter, f/8 and FOV of 1 degree.5 are composed. All these compensating test systems reach very high compensating accuracy, the residual of most tested surfaces is less than (lambda) /100. A formula of third order spherical aberration is derived and applied to initial solution of compensator. The initial structure of the compensator is in correspondence with the optimal result very well. Finally, taking high order aspherical plate as an example, we discuss in detail the test system errors, and give some ideas of reducing test system error or loosing requirement of fabrication tolerance.

Citation Download Citation

Guanqing Lin and Meiliang Yi "Method and system of compensating test for high-order aspherics", Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); https://doi.org/10.1117/12.369211

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