Analysis of the surface of human skin

Christoph Hof; Reinhart A. Lunderstaedt

doi:10.1117/12.366698

25 October 1999 Analysis of the surface of human skin

Christoph Hof, Reinhart A. Lunderstaedt

Proceedings Volume 3784, Rough Surface Scattering and Contamination; (1999) https://doi.org/10.1117/12.366698
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

As every branch of industry the cosmetic industry has to control the quality of its products and to prove the assured treatment effects. Therefore, the structure of human skin is measured by mechanical or optical devices and the measurement data have to be analyzed. Until today, the devices commonly used in the industry only allow to measure profiles of replicas of the human skin and the methods of data analysis are classical methods e.g. digital filtering or Fourier Transform (FT). Recently, one can also find new methods such as in-vivo measurement of human skin with systems using active image triangulation or the Wavelet Transform for analysis and filtering of the raw measurement data. This paper discusses the qualifications of these new methods of measurement and data analysis in comparison to the classical ones.

Citation Download Citation

Christoph Hof and Reinhart A. Lunderstaedt "Analysis of the surface of human skin", Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); https://doi.org/10.1117/12.366698

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