Electromagnetic wave reflection from one-sided metallized chiral layer

Vyacheslav A. Neganov; Oleg V. Osipov

doi:10.1117/12.370208

12 November 1999 Electromagnetic wave reflection from one-sided metallized chiral layer

Vyacheslav A. Neganov, Oleg V. Osipov

Proceedings Volume 3795, Terahertz and Gigahertz Photonics; (1999) https://doi.org/10.1117/12.370208
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The problem of the plane electromagnetic waves of E- and H- polarizations reflection from a metal plane covered by chiral layer of any thickness is strictly solved. The parameter of chirality and layer thickness influence on the electromagnetic waves reflection is investigated. The comparison of results obtained with using of two various notations of the material equations for chiral medium is made. The reflection character of the depolarized component is investigated.

Citation Download Citation

Vyacheslav A. Neganov and Oleg V. Osipov "Electromagnetic wave reflection from one-sided metallized chiral layer", Proc. SPIE 3795, Terahertz and Gigahertz Photonics, (12 November 1999); https://doi.org/10.1117/12.370208

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