Paper
25 April 2000 Radiological x-ray response of polycrystalline mercuric-iodide detectors
Michael M. Schieber, Haim Hermon, Robert A. Street, Steve E. Ready, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Evgenie Meerson, Yehezkel Saado
Author Affiliations +
Abstract
A first image of some tiny screws were obtained for the first time with polycrystalline HgI2 acting as the photoconductor material deposited on a-Si direct conversion X- ray image sensors, produced by Xerox -- Palo Alto Research Center. The initial results are very promising and show a high X-ray sensitivity and low leakage current. The response of these detectors to a radiological X-ray generator of 65 kVp has been studied using the current integration mode. Already its sensitivity expressed in (mu) C/R*cm2, is very high, values of 20 (mu) C/R*cm2 have been measured for films of 100 - 250 microns thickness and bias of 50 - 200 volts respectively, which is superior to the published data for competing materials such as polycrystalline PbI2 and a-Se detectors. The fabrication and characterization measurements of the Polycrystalline HgI2 thick film detectors will be given. The characterization data which will be reported here consists of: (a) sensitivity, (b) dark currents, (c) stability of sensitivity dependence on the number of exposure, (d) X-ray response dependence on dose energy and (e) signal decay dependence on the number of exposures.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Schieber, Haim Hermon, Robert A. Street, Steve E. Ready, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Evgenie Meerson, and Yehezkel Saado "Radiological x-ray response of polycrystalline mercuric-iodide detectors", Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); https://doi.org/10.1117/12.384520
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KEYWORDS
X-rays

Sensors

Electrodes

X-ray detectors

Amorphous silicon

Polymers

Gold

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