GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy

Bart Snijders; Pieter Kappelhof; Ben C. Braam; H. J. P. Vink; Peter Verhoeff; Bertrand Calvel; Frederic Safa

doi:10.1117/12.390172

5 July 2000 GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy

Bart Snijders, Pieter Kappelhof, Ben C. Braam, H. J. P. Vink, Peter Verhoeff, Bertrand Calvel, Frederic Safa

Proceedings Volume 4006, Interferometry in Optical Astronomy; (2000) https://doi.org/10.1117/12.390172
Event: Astronomical Telescopes and Instrumentation, 2000, Munich, Germany

Abstract

A test-bench simulating the GAIA metrology system has been developed by TNO-TPD. The lines-of-sight of the two telescopes in the GAIA instrument are separated by an angle (called `basic angle') of about 106 degrees. The basic angle stability should be within 10 microarcsecond rms over the satellite revolution period of 3 hours, or should be at least known with this accuracy. The basic angle is monitored by a high-precision interferometric laser metrology system.

Citation Download Citation

Bart Snijders, Pieter Kappelhof, Ben C. Braam, H. J. P. Vink, Peter Verhoeff, Bertrand Calvel, and Frederic Safa "GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy", Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); https://doi.org/10.1117/12.390172

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