Pointing out the structure of double layers through spectroscopic methods

Benedict Oprescu; Mircea Sanduloviciu

doi:10.1117/12.378706

23 February 2000 Pointing out the structure of double layers through spectroscopic methods

Benedict Oprescu, Mircea Sanduloviciu

Proceedings Volume 4068, SIOEL '99: Sixth Symposium on Optoelectronics; (2000) https://doi.org/10.1117/12.378706
Event: SIOEL: Sixth Symposium of Optoelectronics, 1999, Bucharest, Romania

Abstract

This paper investigates the dependence of local emissivity, for two spectrum lines of helium, upon the location within a stationary double layer. The experimental result are explained starting from a new phenomenological model, which takes into account the non-elastic interactions between the accelerated electrons and the atoms of the working gas.

Citation Download Citation

Benedict Oprescu and Mircea Sanduloviciu "Pointing out the structure of double layers through spectroscopic methods", Proc. SPIE 4068, SIOEL '99: Sixth Symposium on Optoelectronics, (23 February 2000); https://doi.org/10.1117/12.378706

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