Observation of microstructures on the recording films of Ag8In14Sb55Te23 and phthalocyanine by AFM

Jielin Sun; Fuxi Gan

doi:10.1117/12.416859

7 February 2001 Observation of microstructures on the recording films of Ag8In14Sb55Te23 and phthalocyanine by AFM

Jielin Sun, Fuxi Gan

Proceedings Volume 4085, Fifth International Symposium on Optical Storage (ISOS 2000); (2001) https://doi.org/10.1117/12.416859
Event: Fifth International Symposium on Optical Storage (IS0S 2000), 2000, Shanghai, China

Abstract

Thin film of Ag₈In₁₄Sb₅₅Te₂₃ was prepared by RF-magnetron sputtering method, and the organic dye (phthalocyanine) thin film was prepared by spin coating. Micro- and submicro-size changes induced by laser irradiation on the film were studied by atomic force microscopy (AFM). The characteristic of recorded spots topography is related by recording condition (laser power, pulse width etc.) and properties of material (phase-change or shape-change). The mechanism of microstructure formation is discussed.

Citation Download Citation

Jielin Sun and Fuxi Gan "Observation of microstructures on the recording films of Ag8In14Sb55Te23 and phthalocyanine by AFM", Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); https://doi.org/10.1117/12.416859

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