Paper
6 November 2000 Pulsed laser nitridation of InP
Naoko Aoki, Toshimitsu Akane, Koji Sugioka, Koichi Toyoda, Jan J. Dubowski, Katsumi Midorikawa
Author Affiliations +
Proceedings Volume 4088, First International Symposium on Laser Precision Microfabrication; (2000) https://doi.org/10.1117/12.405737
Event: First International Symposium on Laser Precision Microfabrication (LPM2000), 2000, Omiya, Saitama, Japan
Abstract
Nitridation of semiconductor surfaces is attractive for passivation as well as fabrication of new materials. Nitridation of the III-V semiconductors has been mainly reported for GaAs. In this paper, we demonstrate the surface nitridation of InP by KrF excimer laser irradiation in an NH3 ambient. The laser fluence was fixed at 80 mJ/cm2 and number of pulses was changed from 500 to 10,000. S-ray photoelectron spectroscopy (XPS) analysis of the nitrided samples reveals that the InP surface contains both InNx and PNy compounds. Nitrogen content increases with the increase of number of pulses. Near- stoichiometric InN and P3N5 are formed by the 2500- pulse irradiation. Aging test reveals that the nitrided samples show anti-oxidation property, which is improved as the number of pulses increases.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Naoko Aoki, Toshimitsu Akane, Koji Sugioka, Koichi Toyoda, Jan J. Dubowski, and Katsumi Midorikawa "Pulsed laser nitridation of InP", Proc. SPIE 4088, First International Symposium on Laser Precision Microfabrication, (6 November 2000); https://doi.org/10.1117/12.405737
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Indium nitride

Excimer lasers

Nitrogen

Oxides

Pulsed laser operation

Atomic force microscopy

Oxidation

Back to Top