Paper
7 March 2006 Measurement and control of the bending of x-ray mirrors using speckle interferometry
Pierre M. Jacquot, Massimo Facchini, Muriel Mattenet, Gerhard Gruebel
Author Affiliations +
Abstract
Speckle interferometry (SI) is used for the measurement of the shape change of x-ray mirrors. Initially flat under thermal equilibrium, the mirror, or "thermal bender", is deliberately and adaptively bent by means of well-controlled temperature gradients. As the deflection of an optically polished surface can be obtained by a number of methods, the choice of SI and its subsequent advantages are discussed. Quantitative results are reported, referring to four kinds of tests: conformity, stability, sensitivity and repeatability tests. SI is recognized to meet the expectations: it provides a simple, complete, sensitive and accurate control of the shape of the bent x-ray mirrors.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre M. Jacquot, Massimo Facchini, Muriel Mattenet, and Gerhard Gruebel "Measurement and control of the bending of x-ray mirrors using speckle interferometry", Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); https://doi.org/10.1117/12.498444
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KEYWORDS
Mirrors

X-rays

Speckle interferometry

Surface finishing

Interferometry

Polishing

Reflection

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