Hole injection from indium tin oxide into triphenyl diamine

Yulong Shen; Daniel B. Jacobs; George G. Malliaras

doi:10.1117/12.416881

2 February 2001 Hole injection from indium tin oxide into triphenyl diamine

Yulong Shen, Daniel B. Jacobs, George G. Malliaras

Proceedings Volume 4105, Organic Light-Emitting Materials and Devices IV; (2001) https://doi.org/10.1117/12.416881
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

We have measured the electrical characteristics at the contact between Indium Tin Oxide (ITO) and N-N'-diphenyl-N- N'-bis(3-methylphenyl)-1-1-biphenyl-4,4'-diamine (TPD). By carrying out independent measurements of the hole mobility in the organic layer we are able to isolate the injection and the transport processes and study the electrical characteristics of the contact alone. We find that the contact is in fact not Ohmic, but current-limiting, despite the fact that the current has a similar electric field dependence as the space charge limited current. The contact remains current-limiting even when the hole mobility is lowered by three orders of magnitude by diluting TPD into polycarbonate. The data support a model of injection in disordered materials.

Citation Download Citation

Yulong Shen, Daniel B. Jacobs, and George G. Malliaras "Hole injection from indium tin oxide into triphenyl diamine", Proc. SPIE 4105, Organic Light-Emitting Materials and Devices IV, (2 February 2001); https://doi.org/10.1117/12.416881

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