Thin film Z-scan measurements of the nonlinear response of novel conjugated silicon-ethynylene polymers and metal-containing complexes incorporated into polymeric matrices

William E. Douglas; Larisa G. Klapshina; Anatoly Nikolaevich Rubinov; George A. Domrachev; Boris A. Bushuk; Oleg Leonidovich Antipov; Vladimir V. Semenov; Alexander Sergeevich Kuzhelev; Sergey B. Bushuk; Julia A. Kalvinkovskaya

doi:10.1117/12.408525

29 November 2000 Thin film Z-scan measurements of the nonlinear response of novel conjugated silicon-ethynylene polymers and metal-containing complexes incorporated into polymeric matrices

William E. Douglas, Larisa G. Klapshina, Anatoly Nikolaevich Rubinov, George A. Domrachev, Boris A. Bushuk, Oleg Leonidovich Antipov, Vladimir V. Semenov, Alexander Sergeevich Kuzhelev, Sergey B. Bushuk, Julia A. Kalvinkovskaya

Author Affiliations +

Proceedings Volume 4106, Linear, Nonlinear, and Power-Limiting Organics; (2000) https://doi.org/10.1117/12.408525
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The third-order optical nonlinearities of new conjugated poly[(arylene)(ethynylene)silylene]s, and a variety of chromium, neodymium or cobalt complexes incorporated into polymeric matrices as thin sol-gel or polyacrylonitrile films have been determined by using a single beam Z-scan technique. The samples were pumped by a single ultrashort pulse of a mode-locked Nd-phosphate glass laser (wavelength 1054 nm) with a 5ps pulse duration (full width at half- maximum), the repetition rate of the Gaussian beam being low (0.3Hz) ro avoid thermal effects. The spot radius of the focused pulse was ca. 60micrometers , its beam waist being in the sample (intensity up to 4x10¹³ Wm^-2). Calibration was done with chloroform and benzene, the value of N₂ for the latter (2x10^-12esu) being similar to that previously reported. A small-aperture Z-scan (S=0.03) was used to measure the magnitude and the sign of the nonlinear refractive index, n₂. Very high nonlinear refractive indices were found for a film containing (a) a poly[(arylene)(ethynylene)silylene]s with pentacoordinated silicon (c 5 gl^-1) in a sol-gel matrix (N₂ = 6 x 10^-13 cm²W^-1), (b) a film containing a poly[(arylene)(ethynylene)silylene] with tetracoordinated silicon (c 0.5 gl^-1) and a very small proportion of fullerene-C₇₀ incorporated into an NH₂-containing sol-gel matrix (n₂ = 5x10^-13 cm²W^-1, and (c) a thin polyacrylonitrile film of polycyanoethylate bis-arenechromium(I) hydroxide (n₂ = -5 x 10^{-12 cm(superscript 2}W^-1.

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William E. Douglas, Larisa G. Klapshina, Anatoly Nikolaevich Rubinov, George A. Domrachev, Boris A. Bushuk, Oleg Leonidovich Antipov, Vladimir V. Semenov, Alexander Sergeevich Kuzhelev, Sergey B. Bushuk, and Julia A. Kalvinkovskaya "Thin film Z-scan measurements of the nonlinear response of novel conjugated silicon-ethynylene polymers and metal-containing complexes incorporated into polymeric matrices", Proc. SPIE 4106, Linear, Nonlinear, and Power-Limiting Organics, (29 November 2000); https://doi.org/10.1117/12.408525

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