Paper
13 June 2001 Determination of the normalized Jones matrix of elliptical retarder
Svitlana Berezhna, Ihor Berezhnyy, Masahisa Takashi
Author Affiliations +
Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429559
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore
Abstract
Although photo elasticity technique has recently become sufficiently refined due to use of digital image processing, the difficulties with an appropriate accuracy, especially in integrated photo elasticity still persist. Specifically, there remain as problem with a precise imaging of three optical parameters describing a general 3D model in the regions, where mutual interference of these parameters leads to deteriorated accuracy. In this paper it is shown how to improve imaging accuracy of PSA Fourier polarimetry method, recently suggested for use in integrated photo elasticity. This can be overcome by incorporation of a compensator into the polarimeter arrangement. Use of the compensator provides equally precise imaging of birefringence through the whole possible range of phase and ellipticity angle values. Also, it allows for determining a sign of phase.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Svitlana Berezhna, Ihor Berezhnyy, and Masahisa Takashi "Determination of the normalized Jones matrix of elliptical retarder", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); https://doi.org/10.1117/12.429559
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Cited by 2 scholarly publications.
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KEYWORDS
Polarimetry

Wave plates

Phase measurement

Birefringence

Photoelasticity

Signal detection

Polarizers

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