MIRAGE emitter improvements & technology review

Steven Lawrence Solomon; Alan Irwin; Jim Oleson; Kevin Sparkman; Anthony M. Gallagher; William Lin; Jianmei Pan

doi:10.1117/12.438101

31 August 2001 MIRAGE emitter improvements & technology review

Steven Lawrence Solomon, Alan Irwin, Jim Oleson, Kevin Sparkman, Anthony M. Gallagher, William Lin, Jianmei Pan

Proceedings Volume 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI; (2001) https://doi.org/10.1117/12.438101
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

With the increased demand for IR sensor and surveillance systems, there is a growing need for technologies to support their operational readiness. Measurement of sensor characteristics such as sensitivity, MRTD, and dynamic range should be standard in all mission critical systems. The Real-Time Infrared Test Set (RTIR) is a portable system designed to provide in-the-field calibration and testing of IR imaging systems and seekers. RTIR uses the high volume manufacturing processes of the Very Large Scale Integration (VLSI) and the Micro Electromechanical Systems (MEMS) technology to produce a Thermal Pixel Array (TPA). State-of-the-art CMOS processes define all the necessary on-chip digital and analog electronics. When properly driven, this array generates variable temperature,synthetic IR scenes. A nonuniformity measurement of several TPAs is presented.

Citation Download Citation

Steven Lawrence Solomon, Alan Irwin, Jim Oleson, Kevin Sparkman, Anthony M. Gallagher, William Lin, and Jianmei Pan "MIRAGE emitter improvements & technology review", Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); https://doi.org/10.1117/12.438101

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