Electronic display metrology: not a simple matter

Edward F. Kelley

doi:10.1117/12.431252

18 June 2001 Electronic display metrology: not a simple matter

Edward F. Kelley

Proceedings Volume 4450, Harnessing Light: Optical Science and Metrology at NIST; (2001) https://doi.org/10.1117/12.431252
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye sees can be very difficult to capture accurately and quickly in a meaningful way. With the advent of many new display technologies, there is a need to a level playing field so that different technologies can be compared on an equivalent basis. Orchestrating display metrology to accomplish this is wrought with several difficulties that will be reviewed especially in the areas of stray light management/measurement and meaningful reflection characterization.

Citation Download Citation

Edward F. Kelley "Electronic display metrology: not a simple matter", Proc. SPIE 4450, Harnessing Light: Optical Science and Metrology at NIST, (18 June 2001); https://doi.org/10.1117/12.431252

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