AMSD test error budget sensitivity analysis

Patrick J. Reardon; James B. Hadaway; Joseph M. Geary; Bruce R. Peters; H. Philip Stahl; Ron Eng; John W. Keidel; Jeffrey R. Kegley

doi:10.1117/12.453642

27 December 2001 AMSD test error budget sensitivity analysis

Patrick J. Reardon, James B. Hadaway, Joseph M. Geary, Bruce R. Peters, H. Philip Stahl, Ron Eng, John W. Keidel, Jeffrey R. Kegley

Author Affiliations +

Proceedings Volume 4451, Optical Manufacturing and Testing IV; (2001) https://doi.org/10.1117/12.453642
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

The successful augmentation of NASA's X-Ray Cryogenic Facility (XRCF) at the Marshall Space Flight Center (MSFC) to an optical metrology testing facility for the Sub-scale Beryllium Mirror Development (SBMD) and NGST Mirror Sub-scale Development (NMSD) programs required significant modifications and enhancements to achieve useful and meaningful data. In addition to building and integrating both a helium shroud and a rugged and stable platform to support a custom sensor suite, the sensor suite was assembled and integrated to meet the performance requirements for the program. The subsequent evolution from NMSD and SBMD testing to the Advanced Mirror System Demonstrator (AMSD) program is less dramatic in some ways, such as the reutilization of the existing helium shroud and sensor support structure. However, significant modifications were required to meet the AMSD program's more stringent test requirements and conditions resulting in a substantial overhaul of the sensor suite and test plan. This overview paper will discuss the instrumentation changes made for AMSD, including the interferometer selection, null optics, and radius of curvature measurement method. The error budgeting process will be presented, and the overall test plan developed to successfully carry out the tests will be discussed.

Citation Download Citation

Patrick J. Reardon, James B. Hadaway, Joseph M. Geary, Bruce R. Peters, H. Philip Stahl, Ron Eng, John W. Keidel, and Jeffrey R. Kegley "AMSD test error budget sensitivity analysis", Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); https://doi.org/10.1117/12.453642

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