Paper
30 July 2001 Characterizing polarization controllers with Mueller matrix polarimetry
Author Affiliations +
Proceedings Volume 4532, Active and Passive Optical Components for WDM Communication; (2001) https://doi.org/10.1117/12.436039
Event: ITCom 2001: International Symposium on the Convergence of IT and Communications, 2001, Denver, CO, United States
Abstract
A system for characterizing polarization controllers and other fiber components with Mueller matrices is presented. Most polarization controllers, such as lithium niobate modulators or PLZT electro-optical modulators, exhibit a wide range of polarization behaviors at constant drive voltage including elliptical retardance, polarization dependant loss (PDL), and depolarization. Specifying the half wave voltage for such devices describes their desired characteristic, an electrically addressable retardance, but not the undesired characteristics. Devices with complex polarization behaviors require a similarly comprehensive description of their polarization effects. We present example measurements that demonstrate how the Mueller matrix as a function of voltage provides a complete description of the desired retardance and the undesired PDL. Such polarization controller Mueller matrices can be multiplied with Mueller matrices for other photonic components to quantify how component polarizations interact.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan J. Drewes, Russell A. Chipman, and Matthew H. Smith "Characterizing polarization controllers with Mueller matrix polarimetry", Proc. SPIE 4532, Active and Passive Optical Components for WDM Communication, (30 July 2001); https://doi.org/10.1117/12.436039
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Cited by 8 scholarly publications.
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KEYWORDS
Polarization

Polarimetry

Mueller matrices

Lead

Modulators

Birefringence

Electro optics

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