1024x1024 resistive emitter array design and fabrication status

Paul Tristan Bryant; Jim Oleson; Stephen W. McHugh; Eric Beuville; John D. Schlesselmann; James T. Woolaway II; Steve Barskey; Steven Lawrence Solomon; Thomas W. Joyner

doi:10.1117/12.474711

12 July 2002 1024x1024 resistive emitter array design and fabrication status

Paul Tristan Bryant, Jim Oleson, Stephen W. McHugh, Eric Beuville, John D. Schlesselmann, James T. Woolaway II, Steve Barskey, Steven Lawrence Solomon, Thomas W. Joyner

Author Affiliations +

Proceedings Volume 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII; (2002) https://doi.org/10.1117/12.474711
Event: AeroSense 2002, 2002, Orlando, FL, United States

Abstract

Santa Barbara Infrared (SBIR) is producing a high performance 1,024 x 1,024 Large Format Resistive emitter Array (LFRA) for use in the next generation of IR Scene Projectors (IRSPs). LFRA requirements were developed through close cooperation with the Tri-Service IR Scene Projector working group, and through detailed trade studies sponsored by the OSD Central T&E Investment Program (CTEIP) and a Phase I US Navy Small Business Innovative Research (SBIR) contract. The CMOS Read-In Integrated Circuit (RIIC) is being designed by SBIR and Indigo Systems under a Small Business Innovative Research (SBIR) contract. Performance and features include 750 K MWIR maximum apparent temperature, 5 ms radiance rise time, 200 Hz full frame update, and 400 Hz window mode operation. Ten 8-inch CMOS wafers will be fabricated and characterized in mid-2002, followed by emitter fabrication in late 2002. This paper discusses array performance, requirements flow-down, array design, fabrication of 2 X 2-inch CMOS devices, and plans for subsequent RIIC wafer test and emitter pixel fabrication.

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Paul Tristan Bryant, Jim Oleson, Stephen W. McHugh, Eric Beuville, John D. Schlesselmann, James T. Woolaway II, Steve Barskey, Steven Lawrence Solomon, and Thomas W. Joyner "1024x1024 resistive emitter array design and fabrication status", Proc. SPIE 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII, (12 July 2002); https://doi.org/10.1117/12.474711

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