Paper
13 September 2002 Deposition of chemically sensitive polymer films by picosecond resonant infrared laser ablation
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Abstract
Pulsed laser deposition of complex, chemically sensitive polymers using tunable, picosecond infrared laser excitation has shown great promise for producing films of these materials appropriate for a wide variety of sensor and coating applications. Fourier-transform infrared spectra of the bulk starting polymers and those of the deposited thin films are nearly identical, verifying that the short-range order and chemical functionality of the polymers are preserved during the process. Gel permeation chromatography and mass spectrometry have been used to characterize the polydispersity of the mass distribution; here the results are mixed, with the mass distributions of some poly-mers being preserved while others show significant bond scission. Most recently, we have demonstrated that it is possible to coat cantilever structures with the polymer SFXA; the deposited polymer responds as desired when 'challenged' by appropriate chemicals.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel M. Bubb, John H. Callahan, Richard F. Haglund Jr., Eric J. Houser, James S. Horwitz, Robert Andrew McGill, and Michael R. Papantonakis "Deposition of chemically sensitive polymer films by picosecond resonant infrared laser ablation", Proc. SPIE 4760, High-Power Laser Ablation IV, (13 September 2002); https://doi.org/10.1117/12.482092
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KEYWORDS
Polymers

Free electron lasers

Laser ablation

Polymer thin films

Sensors

Pulsed laser deposition

FT-IR spectroscopy

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