Recent results from thin-film-coated semiconductor neutron detectors

Douglas S. McGregor; Raymond T. Klann; Jeffrey D. Sanders; John T. Lindsay; Kurt J. Linden; Holly K. Gersch; P. M. De Lurgio; Charles L. Fink; Elsa Ariesanti

doi:10.1117/12.455697

10 January 2003 Recent results from thin-film-coated semiconductor neutron detectors

Douglas S. McGregor, Raymond T. Klann, Jeffrey D. Sanders, John T. Lindsay, Kurt J. Linden, Holly K. Gersch, P. M. De Lurgio, Charles L. Fink, Elsa Ariesanti

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Proceedings Volume 4784, X-Ray and Gamma-Ray Detectors and Applications IV; (2003) https://doi.org/10.1117/12.455697
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Semiconductor based thermal neutron detectors provide a compact technology for neutron detection and imaging. Such devices can be produced by externally coating semiconductor charged particle detectors with neutron reactive films that convert free neutrons into charged-particle reaction products. Commonly used films for such devices utilize the ¹⁰B(n,a)⁷Li reaction or the ⁶Li(n,a)³H reaction, which are attractive due to the relatively high energies imparted to the reaction products. Unfortunately, thin film or "foil" type thermal neutron detectors suffer from self-absorption effects that ultimately limit neutron detection efficiency. Design considerations that maximize the efficiency and performance of such devices are discussed. Linear arrays fabricated from thin-film-coated pixel detectors are presented with results.

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Douglas S. McGregor, Raymond T. Klann, Jeffrey D. Sanders, John T. Lindsay, Kurt J. Linden, Holly K. Gersch, P. M. De Lurgio, Charles L. Fink, and Elsa Ariesanti "Recent results from thin-film-coated semiconductor neutron detectors", Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); https://doi.org/10.1117/12.455697

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