Paper
25 September 2002 Sensitive measurements of two-dimensional birefringence distributions using near-circularly polarized beam
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Abstract
Image processing algorithms for measuring two-dimensional distributions of linear birefringence using a pair of variable retarders are proposed. Several algorithms using from 2 to 5 recorded frames allow to make fast or real time measurements, increase sensitivity and suppress measurement errors. Moreover, the described algorithms can be applied for proposed birefringence imaging systems with fixed retarders and/or Faraday rotators, including systems with images acquired in time sequences or as sets of parallel images.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael I. Shribak and Rudolf Oldenbourg "Sensitive measurements of two-dimensional birefringence distributions using near-circularly polarized beam", Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); https://doi.org/10.1117/12.463750
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Cited by 7 scholarly publications.
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KEYWORDS
Wave plates

Polarization

Birefringence

Liquid crystals

Polarizers

Microscopes

Imaging systems

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