Paper
24 February 2003 The latest developments of high-gain Si microchannel plates
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Abstract
We present our latest results in the development of Silicon micromachined microchannel plates, which open completely new possibilities in the detector technologies. For the first time Z-stacks of Si microchannel plates with pore bias of 5-8 degrees were tested in a high gain photon counting imaging detector without any post-amplification stage with conventional glass MCP's. The gain of Z-stacks of Si (40:1 L/D, 6 μm pores on 8 μm centers, 18-25 mm in diameter) MCP's was found to be as high as ~106 with peaked pulse height distribution. The full-field illumination images appeared to be quite uniform, with relatively small (~±10%) gain variation. Quantum efficiency of opaque diamond photocathode deposited on Si MCP was measured in reflection mode and compared with the performance of flat-substrate diamond photocathodes. We also present the results of our study of long-term gain stability of Si MCP's: variation of Si MCP gain as a function of extracted charge was investigated.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anton S. Tremsin, John V. Vallerga, Oswald H. W. Siegmund, Charles P. Beetz, and Robert W. Boerstler "The latest developments of high-gain Si microchannel plates", Proc. SPIE 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation, (24 February 2003); https://doi.org/10.1117/12.463766
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Cited by 13 scholarly publications and 3 patents.
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KEYWORDS
Microchannel plates

Silicon

Glasses

Sensors

Diamond

Ultraviolet radiation

Photon counting

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