Characterization device for diode-laser-stack beam propagation

Markus Roehner; Holger Muentz; Olaf Schroeder; Konstantin Boucke; Reinhart Poprawe

doi:10.1117/12.472390

30 May 2003 Characterization device for diode-laser-stack beam propagation

Markus Roehner, Holger Muentz, Olaf Schroeder, Konstantin Boucke, Reinhart Poprawe

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472390
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

High beam quality can be achieved by accurate adjustment of the mechanical and micro-optical components in the manufacturing process of high power diode laser stacks. A charaterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.

Citation Download Citation

Markus Roehner, Holger Muentz, Olaf Schroeder, Konstantin Boucke, and Reinhart Poprawe "Characterization device for diode-laser-stack beam propagation", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472390

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