Imaging spectropolarimetry

Eustace L. Dereniak; Nathan A. Hagen; William R. Johnson; Derek S. Sabatke; Ann M. Locke; Robert W. McMillan; Thomas K. Hamilton

doi:10.1117/12.501275

10 October 2003 Imaging spectropolarimetry

Eustace L. Dereniak, Nathan A. Hagen, William R. Johnson, Derek S. Sabatke, Ann M. Locke, Robert W. McMillan, Thomas K. Hamilton

Author Affiliations +

Proceedings Volume 5074, Infrared Technology and Applications XXIX; (2003) https://doi.org/10.1117/12.501275
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

Spectrometry and polarimetry measurements are important to modern science and engineering in an extremely wide variety of fields such as atomic and chemical processes, materials identification and characterization, astronomy, remote sensing, and stress analysis. The basic principle is that when light is emitted or absorbed by, scattered or reflected from, or transmitted through a physical material, its spectral content and polarization state are often affected. Analysis of the changes imposed by these processes then has the potential to reveal useful information about the sources. Example applications are: (1) stress-induced birefringence (photoelasticity); (2) remote sensing, object discrimination, shape measurement; (3) communications (polarization shift keying, deterimental effects on fiber networks); (4) astronomy (solar magnetic fields); (5) scattering, materials identification (retinal nerve fiber layer thickness measurement); (6) ellipsometry (materials characterization, complex index of refraction, layer thicknesses); (7) atomic physics; (8) displays (color LCDs merge colorimetry and polarization).

Citation Download Citation

Eustace L. Dereniak, Nathan A. Hagen, William R. Johnson, Derek S. Sabatke, Ann M. Locke, Robert W. McMillan, and Thomas K. Hamilton "Imaging spectropolarimetry", Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); https://doi.org/10.1117/12.501275

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